JPH075418Y2 - 電極測定用テスター - Google Patents
電極測定用テスターInfo
- Publication number
- JPH075418Y2 JPH075418Y2 JP1990405216U JP40521690U JPH075418Y2 JP H075418 Y2 JPH075418 Y2 JP H075418Y2 JP 1990405216 U JP1990405216 U JP 1990405216U JP 40521690 U JP40521690 U JP 40521690U JP H075418 Y2 JPH075418 Y2 JP H075418Y2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- fixed electrode
- pieces
- electrode pieces
- tester
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 title description 3
- 238000013459 approach Methods 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 125000002066 L-histidyl group Chemical group [H]N1C([H])=NC(C([H])([H])[C@](C(=O)[*])([H])N([H])[H])=C1[H] 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990405216U JPH075418Y2 (ja) | 1990-12-28 | 1990-12-28 | 電極測定用テスター |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990405216U JPH075418Y2 (ja) | 1990-12-28 | 1990-12-28 | 電極測定用テスター |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0494573U JPH0494573U (en]) | 1992-08-17 |
| JPH075418Y2 true JPH075418Y2 (ja) | 1995-02-08 |
Family
ID=31882696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990405216U Expired - Lifetime JPH075418Y2 (ja) | 1990-12-28 | 1990-12-28 | 電極測定用テスター |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH075418Y2 (en]) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0131965Y2 (en]) * | 1984-10-26 | 1989-10-02 | ||
| JPS63107855U (en]) * | 1986-12-27 | 1988-07-12 | ||
| JPH0548131Y2 (en]) * | 1988-06-03 | 1993-12-20 |
-
1990
- 1990-12-28 JP JP1990405216U patent/JPH075418Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0494573U (en]) | 1992-08-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 19951003 |